| سال | هفته | ID | Title | ApplNo | IPC | Applicant | Subgroup | زیر گروه | رشته | شرح | Description |
|---|
2026 | 01 | WO/2026/001281 | TUBE CORE OF MAGNETRON, MAGNETRON AND MICROWAVE APPLIANCE | CN2025/091828 | H01J 23/11 | GUANGDONG MIDEA KITCHEN APPLIANCES MANUFACTURING CO., LTD. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/002579 | METHOD FOR OPERATING A MULTIPLE PARTICLE BEAM SYSTEM AND MULTIPLE PARTICLE BEAM SYSTEM HAVING ELECTROSTATIC TRAPPING ELECTRODES AND/OR A TRAPPING TRENCH SYSTEM FOR PROTECTING THE MICRO-OPTICAL UNIT | EP2025/065633 | H01J 37/04 | CARL ZEISS MULTISEM GMBH | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/002757 | ELECTRON DETECTOR FOR AN ELECTRON MICROSCOPE | EP2025/067106 | H01J 37/244 | CARL ZEISS MICROSCOPY GMBH | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/002812 | MICROCHANNEL PLATE, METHOD FOR PRODUCING SAME, AND CORRESPONDING IMAGE INTENSIFIER TUBE AND NIGHT VISION SYSTEM | EP2025/067353 | H01J 31/50 | PHOTONIS FRANCE | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/002996 | SAMPLER CONES FOR PLASMA INTERFACES | EP2025/067755 | H01J 49/06 | THERMO FISHER SCIENTIFIC (BREMEN) GMBH | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/003010 | IN-SITU DETECTOR BANDWIDTH MEASUREMENT USING IMAGES OF A CHARGED PARTICLE SYSTEM | EP2025/067779 | H01J 37/244 | ASML NETHERLANDS B.V. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/003084 | ELECTROSTATIC LENS | EP2025/067929 | H01J 37/12 | ASML NETHERLANDS B.V. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/003125 | SCANNING DEFLECTOR DESIGN FOR A CHARGED PARTICLE BEAM APPARATUS | EP2025/067987 | H01J 37/24 | ASML NETHERLANDS B.V. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/003717 | FILAMENT AND CATHODE FOR AN X-RAY TUBE | IB2025/056397 | H01J 35/06 | HELMUT FISCHER GMBH INSTITUT FÜR ELEKTRONIK UND MESSTECHNIK | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/003953 | MEASUREMENT SYSTEM AND METHOD | JP2024/022979 | H01J 37/22 | HITACHI HIGH-TECH CORPORATION | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/004371 | X-RAY GENERATION DEVICE | JP2025/017397 | H01J 35/02 | HAMAMATSU PHOTONICS K.K. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/005025 | ELECTRON GUN DRIVE POWER SUPPLY | JP2025/023269 | H01J 35/02 | HAMAMATSU PHOTONICS K.K. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/005228 | BATCH-TYPE SUBSTRATE PROCESSING DEVICE | KR2025/005027 | H01J 37/32 | EUGENE TECHNOLOGY CO., LTD. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/005275 | SUBSTRATE PROCESSING APPARATUS AND METHOD | KR2025/006419 | H01J 37/32 | HANWHA SEMITECH CO., LTD. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/005380 | APPARATUS AND METHOD FOR CONTROLLING ETCH SELECTIVITY AND DAMAGE IN EUV PR/SION PATTERN USING GRID PULSING TECHNIQUE | KR2025/008468 | H01J 37/04 | RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/005591 | A PLASMA REACTOR AND A SYSTEM FOR THE CONVERSION OF REACTANT GAS | MY2025/050037 | H01J 37/32 | AMMOSIS SDN. BHD. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/005598 | A CARTRIDGE FOR A SAMPLE CARRIER, WHICH CARTRIDGE IS REMOVABLY CONNECTABLE TO VARIOUS INSTRUMENTS | NL2025/050308 | H01J 37/20 | DENSSOLUTIONS B.V. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/005919 | ION EXTRACTION OPTICS WITH DYNAMIC EXTRACTION ANGLE CONTROL | US2025/030183 | H01J 37/08 | APPLIED MATERIALS, INC. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/005937 | TUNED FOCUS RING FOR UNIFORMITY IMPROVEMENT OF PLASMA-ASSISTED PROCESSES | US2025/031010 | H01J 37/32 | LAM RESEARCH CORPORATION | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/006346 | ELECTRON IONIZATION SOURCE AND METHODS OF USING THE SAME | US2025/035103 | H01J 27/02 | MKS INC. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 01 | WO/2026/006804 | SCANNING TRANSMISSION ELECTRON MICROSCOPE RESOLUTION AND CONTRAST IMPROVEMENT | US2025/035796 | H01J 37/153 | FEI COMPANY | ELECTRICITY | الکتریسیته | دانش هسته ای |