هفته نامه اطلاع رسانی اختراعات منتشر شده در سازمان جهانی مالکیت فکری
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سالهفتهIDTitleApplNoIPCApplicantSubgroupزیر گروهرشته شرحDescription
202601WO/2026/001281TUBE CORE OF MAGNETRON, MAGNETRON AND MICROWAVE APPLIANCECN2025/091828H01J 23/11GUANGDONG MIDEA KITCHEN APPLIANCES MANUFACTURING CO., LTD.ELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/002579METHOD FOR OPERATING A MULTIPLE PARTICLE BEAM SYSTEM AND MULTIPLE PARTICLE BEAM SYSTEM HAVING ELECTROSTATIC TRAPPING ELECTRODES AND/OR A TRAPPING TRENCH SYSTEM FOR PROTECTING THE MICRO-OPTICAL UNITEP2025/065633H01J 37/04CARL ZEISS MULTISEM GMBHELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/002757ELECTRON DETECTOR FOR AN ELECTRON MICROSCOPEEP2025/067106H01J 37/244CARL ZEISS MICROSCOPY GMBHELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/002812MICROCHANNEL PLATE, METHOD FOR PRODUCING SAME, AND CORRESPONDING IMAGE INTENSIFIER TUBE AND NIGHT VISION SYSTEMEP2025/067353H01J 31/50PHOTONIS FRANCEELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/002996SAMPLER CONES FOR PLASMA INTERFACESEP2025/067755H01J 49/06THERMO FISHER SCIENTIFIC (BREMEN) GMBHELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/003010IN-SITU DETECTOR BANDWIDTH MEASUREMENT USING IMAGES OF A CHARGED PARTICLE SYSTEMEP2025/067779H01J 37/244ASML NETHERLANDS B.V.ELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/003084ELECTROSTATIC LENSEP2025/067929H01J 37/12ASML NETHERLANDS B.V.ELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/003125SCANNING DEFLECTOR DESIGN FOR A CHARGED PARTICLE BEAM APPARATUSEP2025/067987H01J 37/24ASML NETHERLANDS B.V.ELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/003717FILAMENT AND CATHODE FOR AN X-RAY TUBEIB2025/056397H01J 35/06HELMUT FISCHER GMBH INSTITUT FÜR ELEKTRONIK UND MESSTECHNIKELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/003953MEASUREMENT SYSTEM AND METHODJP2024/022979H01J 37/22HITACHI HIGH-TECH CORPORATIONELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/004371X-RAY GENERATION DEVICEJP2025/017397H01J 35/02HAMAMATSU PHOTONICS K.K.ELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/005025ELECTRON GUN DRIVE POWER SUPPLYJP2025/023269H01J 35/02HAMAMATSU PHOTONICS K.K.ELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/005228BATCH-TYPE SUBSTRATE PROCESSING DEVICEKR2025/005027H01J 37/32EUGENE TECHNOLOGY CO., LTD.ELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/005275SUBSTRATE PROCESSING APPARATUS AND METHODKR2025/006419H01J 37/32HANWHA SEMITECH CO., LTD.ELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/005380APPARATUS AND METHOD FOR CONTROLLING ETCH SELECTIVITY AND DAMAGE IN EUV PR/SION PATTERN USING GRID PULSING TECHNIQUEKR2025/008468H01J 37/04RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITYELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/005591A PLASMA REACTOR AND A SYSTEM FOR THE CONVERSION OF REACTANT GASMY2025/050037H01J 37/32AMMOSIS SDN. BHD.ELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/005598A CARTRIDGE FOR A SAMPLE CARRIER, WHICH CARTRIDGE IS REMOVABLY CONNECTABLE TO VARIOUS INSTRUMENTSNL2025/050308H01J 37/20DENSSOLUTIONS B.V.ELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/005919ION EXTRACTION OPTICS WITH DYNAMIC EXTRACTION ANGLE CONTROLUS2025/030183H01J 37/08APPLIED MATERIALS, INC.ELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/005937TUNED FOCUS RING FOR UNIFORMITY IMPROVEMENT OF PLASMA-ASSISTED PROCESSESUS2025/031010H01J 37/32LAM RESEARCH CORPORATIONELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/006346ELECTRON IONIZATION SOURCE AND METHODS OF USING THE SAMEUS2025/035103H01J 27/02MKS INC.ELECTRICITYالکتریسیتهدانش هسته ای
202601WO/2026/006804SCANNING TRANSMISSION ELECTRON MICROSCOPE RESOLUTION AND CONTRAST IMPROVEMENTUS2025/035796H01J 37/153FEI COMPANYELECTRICITYالکتریسیتهدانش هسته ای